Highly Accelerated Stress Test Systems (HAST)
The Hast 1000X and 6000X pressurized humidity test systems offer a fast and cost effective alternative to conventional 85/85 temperature and humidity testing for plastic encapsulated integrated circuits and other microelectronic devices.
Technology leaders in the semiconductor industry have calculated that HAST is 10 to 40 times faster than conventional testing methods. This accelerated testing leads to faster characterization, evaluation and qualification of increasingly complex microelectronic products.
